Thermomechanical strain measurements by synchrotron x-ray diffraction and data interpretation for through-silicon vias

نویسندگان

  • X. Liu
  • P. A. Thadesar
  • C. L. Taylor
  • M. Kunz
  • N. Tamura
  • M. S. Bakir
  • S. K. Sitaraman
  • George W. Woodruff
چکیده

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تاریخ انتشار 2013