Thermomechanical strain measurements by synchrotron x-ray diffraction and data interpretation for through-silicon vias
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Dimension and liner dependent thermomechanical strain characterization of through-silicon vias using synchrotron x-ray diffraction
Strain measurements are demonstrated for through-silicon vias (TSVs) using synchrotron x-ray diffraction to characterize the effect of copper via dimensions and liner materials. Reduction in strains in the silicon around TSVs is observed for the TSVs with smaller via diameters and the TSVs with a thicker polymer liner. To interpret the measured two-dimensional (2D) TSV strain distribution maps ...
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تاریخ انتشار 2013